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SIOS Messtechnik GmbH Nanopositioning & Nanomanipulation system NMM1 X-, Y- and Z-axis resolution of ~0.1nm Measurement volume 25 x 25 x 5mm Choice of probe depending on application AFM, autofocus, fixed focus, inductive, capacitive sensors Surface mapping Industrial surface testing Ideal for MEMS/MOEMS and microstructures Link to SIOS Website View 3D profiling application examples Click here to download a pdf of the technical specification of the Nanopositioning & Nanomanipulation system NMM1   © 2006 Armstrong Optical Ltd    |   tel: +44 (0) 1604 654220    |  e: info@armstrongoptical.co.uk