Armstrong Optical - non-contact thickness measurement & surface profiling

visible & infrared
interferometers & accessories

thermal imaging
& thermography

non-contact 3D and
thickness measurement

systems for distance
& thickness measurement

optical test instruments

standard test charts
& custom designed reticles

optical components
& optomechanical assemblies

high precision motion
& control systems

high speed, multichannel,
self-calibrating streak cameras

microlens arrays
& micro-optical components & structures

High power laser beam delivery systems

Pre-owned optical test equipment for sale

Precitec Optronik GmbH Industrial Measurement Solutions
A range of passive, compact, lightweight optical probes offering high resolution, accuracy and repeatability measurements of form and surface texture, surface mapping plus thickness evaluation of glass bottles, windows, tubing thickness and additionally Si and GaAs wafers. Since these are passive optical probes (ie unpowered, no electrical signal) they are idealy suited to operations in an industrial environment and are easily integrated into production lines. Click here to see a video clip of bottle thickness being measured on a fully operational bottle manufacturing line Visit the Precitec Optronik Website View 3D profiling application examples
	NEW PRODUCTS: CHRocodile M4 sensor system Up to 4 simultaneous, independant measurement channels Submicron measurement resolution Up to 4KHz measurement rate per channel Ideal for all glass thickness measurements All glass colours measured - green, brown etc All container shapes measured Designed for on-line or off-line operation Simple integration into production lines Click here for a production line video clip using the CHRocodile M4 and 25mm optical sensor
	CHRocodile S sensor system Operates with LED light source Up to 2KHz measurement rate Easily integrated into production systems Ideal for optically transparent materials eg glass bottles Used for in-line thickness measurement Budget price
	CHRocodile IT sensor system Operates with IR light source Up to 4KHz measurement rate Ideal for Si or GaAs wafer thickness Si thickness from 7痠 to 1mm Used for in-line thickness measurement during wafer grinding Application areas include solar PV cell and module manufacture, transparent coatings and foils