Armstrong Optical - 3D non-contact surface profiling

Precitec Optronik GmbH Industrial Measurement Solutions
Passive, compact, lightweight optical probes No sample preparation required High resolution, accuracy and repeatability Form and surface texture analysis Surface mapping Thickness evaluation Si/GaAs wafer thickness measurements Glass bottle, window, tubing thickness Industrial environment compatability Easy integration into production lines Variety of OEM sensor systems available on request Visit the Precitec Optronik Website View 3D profiling application examples
	NEW PRODUCTS: CHRocodile M10 sensor system Up to 10 simultaneous, independant measurement channels Submicron measurement resolution Up to 14KHz measurement rate per channel Ideal for all glass thickness measurements Designed for on-line or off-line operation Simple integration into production lines
	CHRocodile S sensor system Operates with LED light source Up to 2KHz measurement rate Easily integrated into production systems Ideal for optically transparent materials eg glass bottles Used for in-line thickness measurement during wafer grinding Budget price
	CHRocodile IT sensor system Operates with IR light source Up to 4KHz measurement rate Ideal for Si or GaAs wafer thickness Si thickness from 7m to 1mm Used for in-line thickness measurement during wafer grinding Application areas include solar cell and module manufacture, transparent coatings and foils