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STIL S.A. Passive, compact, lightweight optical probes No sample preparation required High resolution, accuracy and repeatability Form and surface texture analysis Surface mapping Film thickness evaluation Precision machining quality control Optical dimensional metrology - ROC & asphere characterisation Industrial surface testing Ideal for MEMS/MOEMS, microlens arrays & micro-optics Easy integration into production environments OEM sensor systems available on request Visit the STIL Website View 3D profiling application examples NEW PRODUCT: MPLS multipoint linear system 2 scan field sizes: 1.8mm2 or 45mm2 Submicron height resolution Fast field scan rate: <0.2sec full field Data transfer by fast USB Customisable software Application areas include microelectronics, reverse engineering, surgical/healthcare, shape deformation Ideal for on-line & in-line production environments.... Contact us for more details or a demo Download more product information below: Optical Principles Micromesure 2 - 3D Measuring System Modular Optical Pens CHR controller range CHR 150-L Controller CCS Alpha Controller CCS Controller range CHR150 - PC - Non-Contact Optical Sensor For Dimensional Measurement Chromatic Confocal Imaging CHR Sensor - Measuring examples CHR Monitor CHR Setup CHR DLL - Dynamic Link Library   © 2006 Armstrong Optical Ltd    |   tel: +44 (0) 1604 654220    |  e: info@armstrongoptical.co.uk