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Fogale Nanotech SA Fogale nanotech product overview Introduction to Fogale nanotech products & capabilities Click here to download a pdf of the Fogale nanotech product overview. MicroSurf 3D Non-contact microscope allowing accuracy & repeatability of results High resolution measurements (~0.1nm) Manual stitching to increase aperture Form and surface texture analysis Surface mapping Manual turret for magnification change Compact and easy to use Click here to download a pdf of the technical specification of the MicroSurf 3D system. PhotoMap 3D Non-contact 3D measurements No sample preparation required High resolution, accuracy and repeatability Form and surface texture analysis Surface mapping Automated step height & surface flattening function Few limitations with material type Expandable to 200x200mm with motorised stages Click here to download a pdf of the technical specification of the PhotoMap 3D system. ZoomSurf 3D Fully automated non-contact optical profiling Ideal for both R&D and production environments High resolution, accuracy and repeatability Form and surface texture analysis Surface mapping All axes fully motorised Automatic stitching routines Automated measurement sequencing Easy to use - production ready Click here to download a pdf of the technical specification of the ZoomSurf 3Dsystem. CyberSurf 3D Fully automated control of silicon wafers Automatic wafer load/unload 6" (150mm) and 8" (200mm) wafers, 12" (300mm) on request Automated alignment routines Automated measurement sequencing Custom reporting format Click here to download a pdf of the technical specification of the CyberSurf 3D system. MEMS solution Dynamic measurement of in- and out-of-plane modes for MEMS and MOEMS Optional add-on for Fogale profilers High resolution, accuracy and repeatability Fully automated measurement capability Combines with MEMS Vacuum Box option to allow characterisation under vacuum or thermal loading Cost-effective evaluation method Click here to download a pdf of the technical specification of the ZoomSurf 3D system. lenscan Direct measurement of position & centre thickness of optical elements in an assembly Direct measurement of air-gaps between lenses Direct measurement of glue thickness in doublets Control of asphere positioning for full-field interferometers Absolute accuracy of +/-0.15um over full 600mm range High resolution, accuracy and repeatability Ideal for R&D, production and QA Click here to download a pdf of the technical specification of the lenscan system. Visit the Fogale nanotech Website   © 2006 Armstrong Optical Ltd    |   tel: +44 (0) 1604 654220    |  e: info@armstrongoptical.co.uk