home | news | about us | contact us | links/suppliers | products
interferometers & accessories
thermal imaging
& thermography
non-contact 3D
surface profiling
systems for distance
& thickness measurement
optical test instruments
standard test charts
& custom designed reticles
optical components
& optomechanical assemblies
high precision motion
& control systems
high speed, multichannel,
self-calibrating streak cameras
microlens arrays
& micro-optical components & structures
High power laser beam delivery systems
Pre-owned optical test equipment for sale
| Non-contact 3D Surface Profiling
|
|
|---|---|
 |
........chromatic confocal sensors.............
A wide range of chromatic confocal sensors can be utilised as stand-alone probes or intergrated into complete measurement systems. A choice of Halogen, LED or Xe light source enables flexible surface data analysis. Typical applications include surface topography, material thickness (including Si wafers), on-line glass inspection, plastic film evaluation etc., etc., etc Find out more >> |
 |
........phase deconvolution systems.............
Measurement systems based around a new methodology enabling phase information to be deconvoluted from CCD images allowing 3D evaluation of surfaces. These systems are ideal for micro-scale evaluation of surface roughness and other materials-based applications, biotechnology applications and microscopy where contrast enhancement can be achieved without the use of stains or additional phase-contrast media. Find out more >> |
 |
........white-light interferometric systems.............
White light interferometry-based systems for surface profiling on most materials including the evaluation of MEMS systems operating dynamically. These systems are ideal for micro-scale evaluation of surface roughness and other materials-based applications, biotechnology applications and microscopy where contrast enhancement can be achieved without the use of stains or additional phase-contrast media. Find out more >> |
 |
........SIOS focus sensor.............
A foscus sensor developed for use on the NMM-1 nanopositioning system. Find out more >> |
 |
........SIOS NMM-1 nanopositioning system.............
A ultra-resolving nano positioning system able to incorporate a wide range of sensors from chromatic confocal sensors and laser triangulation systems to AFM to SPM probes Find out more >> |