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interferometers & accessories
thermal imaging
& thermography
non-contact 3D
surface profiling
systems for distance
& thickness measurement
optical test instruments
standard test charts
& custom designed reticles
optical components
& optomechanical assemblies
high precision motion
& control systems
high speed, multichannel,
self-calibrating streak cameras
microlens arrays
& micro-optical components & structures
High power laser beam delivery systems
Pre-owned optical test equipment for sale
| Non-contact 3D Surface Profiling
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........chromatic confocal sensors.............
A wide range of chromatic confocal sensors can be utilised as stand-alone probes or intergrated into complete measurement systems. A choice of Halogen, LED or Xe light source enables flexible surface data analysis. Typical applications include micro-scale evaluation of machined metallic surfaces, paper/cloth, biological samples, microeletronics, automotive & coating industries. Find out more >> |
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........white-light interferometric systems.............
White light interferometry-based systems for surface profiling on most materials including the evaluation of MEMS systems operating dynamically. These systems are ideal for micro-scale evaluation of surface roughness and other materials-based applications, biotechnology applications and microscopy where contrast enhancement can be achieved without the use of stains or additional phase-contrast media. Find out more >> |
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........phase deconvolution systems.............
Measurement systems based around a new methodology enabling phase information to be deconvoluted from CCD images allowing 3D evaluation of surfaces. These systems are ideal for micro-scale evaluation of surface roughness and other materials-based applications, biotechnology applications and microscopy where contrast enhancement can be achieved without the use of stains or additional phase-contrast media. Find out more >> |
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A ultra-resolving nano positioning system able to incorporate a wide range of sensors from chromatic confocal sensors and laser
triangulation systems to AFM to SPM probes Find out more >> |