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interferometers & accessories
thermal imaging
& thermography
non-contact 3D and
thickness measurement
systems for distance
& thickness measurement
optical test instruments
standard test charts
& custom designed reticles
optical components
& optomechanical assemblies
high precision motion
& control systems
high speed, multichannel,
self-calibrating streak cameras
microlens arrays
& micro-optical components & structures
High power laser beam delivery systems
Pre-owned optical test equipment for sale
| Non-contact 3D Surface Profiling and material thickness systems
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........chromatic confocal sensors............. Our wide range of chromatic confocal sensors can be utilised as stand-alone probes or intergrated into complete 3D measurement systems. A choice of halogen, LED or Xe light source enables flexible surface data analysis and material thickness measurement at fast data rates. Typical applications include surface topography, material thickness (including Si wafers), on-line glass bottle inspection, plastic film evaluation etc., etc., etc Find out more >> |
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........SIOS focus sensor............. A focus sensor developed for use on the NMM-1 nanopositioning system. Find out more >> |
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........SIOS NMM-1 nanopositioning system............. A ultra-resolving nano positioning system able to incorporate a wide range of sensors from chromatic confocal sensors and laser triangulation systems to AFM to SPM probes Find out more >> |