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Nano Positioning & Measurement Allowing the use of a variety of different probing systems (AFM, autofocus, confocal chromatic, capacitive etc) The NMM1 enables positioning manipulation, analysis and measurement of surfaces and components with a resolution of 0.1nm in a measurement volume of 25x25x5mm Click here to download a pdf of the technical specification of the NMM-1 For more information and application examples click here   © 2006 Armstrong Optical Ltd    |   tel: +44 (0) 1604 654220    |  e: info@armstrongoptical.co.uk