Armstrong Optical Logo





home | news | about us | contact us | links/suppliers | products
visible & infrared
interferometers & accessories


thermal imaging
& thermography


non-contact 3D and
thickness measurement


systems for distance
& thickness measurement


optical test instruments

standard test charts
& custom designed reticles


optical components
& optomechanical assemblies


high precision motion
& control systems


high speed, multichannel,
self-calibrating streak cameras


microlens arrays
& micro-optical components & structures


High power laser beam delivery systems

Pre-owned optical test equipment for sale


WaveMasterŪ PRO

WaveMasterŪ PRO and WaveMasterŪ PRO Wafer have been designed to meet the requirements for high volume production testing of imaging systems, single lenses or lenses on wafers.

The instruments provide an accurate, reliable and fast way for automatic production testing. With the combination of a fast, high accuracy wavefront sensor and special positioning algorithms a high throughput is achieved.

WaveMasterŪ PRO comes with a tray system in which a high number of single lenses is arranged. In contrast to WaveMasterŪ PRO, the WaveMasterŪ PRO Wafer comprises a special tray system for wafers with a diameter of up to 12 inch and an additional tool which determines the wafer orientation in the instrument. The tray systems of both instruments allow for fully automatic positioning of the lenses during the measurement process.

WaveMasterŪ PRO and WaveMasterŪ PRO Wafer provide lateral resolved information from design or reference data, scratches and lens impurities within a measurement time of less than three seconds for each single lens under test. This allows for direct feedback into the large volume production process. The production software enhances the capabilities of all WaveMasterŪ PRO instruments proving production specific features like pass / fail classification.

WaveMaster
Advantages of WaveMasterŪ PRO and PRO Wafer

  • High throughput due to high measurement speed and fully automatic batch wise or wafer measurement
  • High spatial resolution for extremely accurate measurements
  • Point light sources with different numerical apertures (up to NA 0.95) and working distances
  • Easy loading due to kinematic mount
  • Automatic, high precision linear positioning
  • Measurement either relative or absolute, allows for comparison with a master lens or design data
  • Maximum utilization of the sensor dynamic range with a set of telescopes
  • Full functionality of wavefront analysis and detailed analysis of single lenses and wafer lenses
  • Production software module, for example with export of pass/fail matrix for use in adjacent production line machines
  • Robust and vibration insensitive main frame
  • Flange focal length measurement (FFL)
  • Wafer bow compensation
  • Wafer orientation measurement tool
  • WaveMaster



      © 2006 Armstrong Optical Ltd    |   tel: +44 (0) 1604 654220    |  e: info@armstrongoptical.co.uk