Optical probes for Metrology
For non contact application we supply a non contact centre thickness gauge, chromatic confocal systems as well as a range of optical probes for the SIOS GmbH nanomeasuring machince. (laser focus sensor and white light interferometer). For contact probes based on optical probe technologies SIOS GmbH provides the LM20 Gauge probes and the EPP gauging instrument and the PT test ring. Armstrong Optical also offers a contact centre thickness guage.
For your demonstration please contact Armstrong Optical (44 (0)1604 654220) or CLICK HERE