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interferometers & accessories
thermal imaging
& thermography
non-contact 3D
surface profiling
systems for distance
& thickness measurement
optical test instruments
standard test charts
& custom designed reticles
optical components
& optomechanical assemblies
high precision motion
& control systems
high speed, multichannel,
self-calibrating streak cameras
microlens arrays
& micro-optical components & structures
High power laser beam delivery systems
Pre-owned optical test equipment for sale
25 September 2009: New low cost surface profiling/thickness measurement controller
The new CHRocodile S controller from Precitec Optronik has been designed for both laboratory and production line use and incorporates many different data and control interface possibilities.
18 September 2009: It's PHOTONEX time again
Armstrong Optical will be showing several new and innovative products at the PHOTONEX 09 exhibition on 14th & 15th October. Come along and see us!
15 May 2009: The fight against Swine Fever aided by thermography camera
The IR236 camera system has been installed in the airports of several South East Asian countries enabling the detection of passengers with elevated temperatures.
3 April 2009: New precision movement catalogue from Feinmess Dresden
The newly released catalogue from Feinmess Dresden is now available showing many new products for precision motion and control.
9 March 2009: Testing times for the infrared
A newly designed scanning radiometer from Optikos Corp. for both the MWIR and LWIR wavebands has been supplied to a major UK defence manufacturer.
26 February 2009: Debris shields for the ORION laser at AWE
Debris shields for use on the ORION laser system have been supplied from our partner company Sydor Optics of the USA
19 January 2009: IR Cameras for infrared interferometry
Interferometry sensor systems are now available for the 3-5 micron, 3-14 micron and 8-14 micron wavebands
12 December 2008: Southern Manufacturing exhibition presence
Armstrong Optical will have a booth at Southern Manufacturing event in Farnborough on February 11th & 12th, 2008
28 November 2008: Blind via measurement in Si and GaAs
Using the CHRocodile IT sensor system from Precitec Optronik GmbH high aspect ratio blind vias in both silicon and gallium arsenide can be measured in-process
24 November 2008: Non-contact medical device measurement
Using the CHRocodile sensor systems from Precitec Optronik GmbH it is possible to measure shape and thickness of medical devices such as ballons and tubing at high speed in a non-contact manner
9 October 2008: Glass shape & thickness on the production line
Using the CHRocodile M4 system from Precitec Optronik GmbH glass containers in all shapes and colours can be evaluated at line speeds of ~350 per minute
11 September 2008: New representation confirmed
Precitec Optronik GmbH of Rodgau have agreed that Armstrong Optical will distribute their non-contact profiling systems and OEM sensors for glass and silicon wafer thickness in the UK
19 August 2008: Exhibition presence confirmed
Armstrong Optical will have a booth at ‘MEET THE BUYER’ 2008 - Doing Business with the World’s Scientific Research Facilities event at the Royal Horticultural Halls, London on September 16th