Aspheric lenses are of increasing importance in today’s optical industry. In a multitude of different areas of application single aspheric lenses are used instead several spherical lenses to build compact imaging systems. Thereby, the size and the weight of the systems are considerably reduced.

These systems have to be checked not only for their imaging properties after completion of the production process, but also after individual steps in the production process during the assembly.

In most of the cases conventional methods cannot be used for this kind of testing. Although e.g. the measurement of the modulation transfer function is a well-established method for fast and accurate quality inspection of entire objectives it has its limitation for non-imaging systems.

In contrast to this, Shack-Hartmann sensors are able to measure a very broad range of spherical and aspherical lenses as well as partially or fully assembled objectives due to their large dynamic range. In addition the high measurement frequency allows for real time testing and analysis.

 

WaveSensor®

High precision Shack-Hartmann wavefront sensors with large dynamic range

 

WaveMaster® UST

Automatic, full-field characterization of wavefront defects in large, bi-telecentric lenses

 

WaveMaster® Compact

Ideally suited for wavefront measurement of single lenses for quality assurance

 

WaveMaster® Plan

Wavefront measurement of planar optical elements

 

WaveMaster® PRO 2 & PRO 2 Wafer

Wavefront measurement systems with Shack-Hartmann Sensors for Series Testing of Lenses and Optical Wafers

 

WaveMaster® Compact Universal

Measuring the wavefront and surface topography of a lens

 

WaveMaster® IOL 2

The solution of the wavefront measurements of IOLs

 

WaveMaster® Compact Reflex

Surface topography measurement with Shack-Hartmann sensors

 

Additional Information
WaveSensor® Product Flyer
WaveMaster ® Compact Universal Flyer
OptiSpheric® IOL Family and WaveMaster® IOL 2 Flyer

 

Surface measurement in reflection with a Shack-Hartmann sensor

Surface measurement in reflection with a Shack-Hartmann sensor

 

Wavefront sensor with illumination automatically measures the entire field of bi-telecentric lenses

Wavefront sensor with illumination automatically measures the entire field of bi-telecentric lenses

 

 

WaveMaster® Compact for Shack-Hartmann based wavefront measurement

WaveMaster® Compact for Shack-Hartmann based wavefront measurement

 

Wavefront and surface measurement with WaveMaster® Compact Universal

Wavefront and surface measurement with WaveMaster® Compact Universal

 

The WaveMaster® IOL 2 with single lens holder for measurement of IOLs in-air

The WaveMaster® IOL 2 with single lens holder for measurement of IOLs in-air

 

For your demonstration please contact Armstrong Optical (44 (0)1604 654220) or CLICK HERE

Price: £0.00