Interferometric Method for Non-Transparent (opaque) Materials
Using an infrared source and detector, visually opaque materials such as silicon wafers or black plastic bottles can be measured. Based on the reflected light from the two (or more) surfaces, the interference pattern can be used to determine thickness. If there are multiple layers, those individual thicknesses can also be determined, as well as the total thickness. Since the optical probe contains no electronics or moving parts, it is very robust for inline applications, even in wet, acidic or dirty environments.

 

Applications:
  • Multiple SLD sources available
  • Thickness range from 4μm - 15mm
  • Independent of colour and temperature
  • Speeds up to 70kHz
  • Special sensors for rough, doped and thin wafers
  • Small spot diameter
  • Easy to integrate inline or with other sensors
  • Multi-channel systems available

 

Products:

CHRocodile DW

The CHRocodile DW optical sensor works with infrared light and was specifically optimized for easy gauge measuring for highly-remunerated wafers. Additional application areas are the gauge measurement of visual opaque as well as transparent plastics. The interferometric measuring procedure provides a high-resolution and solid measurement of one side. The exceptional high dynamic and the excellent signal/noise ratio provide the best measuring result.

 

CHRocodile IT 500/100 (RW)

The CHRocodile IT optical sensor family work with infrared light and is perfectly suitable for easy gauge measuring of visually non-transparent materials on one side as well. The various versions guarantees the optimum matching solution for numerous applications. Wafers in all stages of production can be measured precisely offline and inline within a gauge range of 10 µm - 3000 µm. Additional application areas are the gauge measurement of visual opaque as well as transparent plastic products.

 

CHRocodile IT 18 - 3000

The CHRocodile IT 18-3000 optical sensor works with infrared light and is perfectly suitable for easy gauge measuring of visually non-transparent materials on one side as well. The large measuring area of 18 µm to 3000 µm makes it universally applicable for many measuring tasks in the quality assurance and production of glass and plastic products. The exceptional high dynamic and the excellent signal/noise ratio of the CHRocodile TW sensors provide the best measuring result on various strongly reflecting surfaces.

 

CHRocodile IT 150 -15000

The CHRocodile IT 150-15000 optical sensor works with infrared light and is perfectly suitable for easy gauge measuring of visually non-transparent materials on one side as well. The large measuring area of 150 µm to 15000 µm makes it universally applicable for many measuring tasks in the quality assurance and production of glass and plastic products. The exceptional high dynamic and the excellent signal/noise ratio of the CHRocodile TW sensors provide the best measuring result on various strongly reflecting surfaces.

 

CHRocodile IT TW

The CHRocodile IT - TW optical sensor works with infrared light and has been specially optimized for the non-contact measurement of the thickness of thin wafers. Further fields of application include the thickness measurement of visually opaque and transparent plastic films. The interferometric measuring technique allows high-resolution and robust measurement from one side. The extraordinarily high dynamic response and the outstanding signal-to-noise ratio of the CHRocodile sensors ensure the best measuring results.

 

CHRomatic Confocal Principle for Synchronized Dual-Sided Thickness Measurements

The highly versatile chromatic confocal principle can be used to measure distance on nearly all substrates. By synchronizing two of these measurements, it is possible to measure the thickness of materials that are completely opaque, such as metals or opaque wafers.

 

CHRomatic Confocal Principle for Synchronized Dual-Sided Thickness Measurements

Precitec CHRomatic Confocal Principle for Synchronized Dual-Sided Thickness Measurements

 

Applications:
  • Halogen, xenon or LED sources available
  • Unlimited thickness range
  • Independent of color and temperature
  • Speeds up to 66kHz
  • Simultaneous distance and thickness information
  • Small spot size
  • Easy to integrate inline or with other sensors
  • Multi-channel systems available

 

CHRocodile C

Precitec CHRocodile CPrecitec CHRocodile C Custom Stand Measuring Measure Thickness of glass wafer

The image on the right shows the CHRocodile C on a custom stand, measuring the thickness of a glass wafer.
The ultra compact CHRocodile C sensor with its robust and integrated design offers high precision distance and thickness measurements.
CHRocodile C is specially suited for industrial inline use and easily integrable into any kind of inspection machine.
The extraordinary high dynamic range and the outstanding signal-to-noise ratio of the CHRocodile sensors ensure the best measuring results on any kind of surfaces.
Thanks to its compact dimensions and excellent performance/price ratio, CHRocodile C is the ideal alternative to classical laser triangulation sensors.

 

The sensors below require Optical Probes:

 

CHRocodile S / SE

The CHRocodile SE and S optical sensors are the fast all-rounder with an excellent cost/performance ratio.  They are perfectly suitable for demanding measuring tasks, like non-contact measurement of topography and layer gauge. The senor implements two different measuring procedures and thus provides gauge measurements of 2 µm to 37 mm. The exceptional high dynamic and the excellent signal/noise ratio of the CHRocodile sensors provide the best measuring result on various strongly reflecting and strongly steep surfaces.

 

CHRocodile 2 S / 2 SE

Next generation models of CHRocodile sensors offering up to 66.000 measurements/second. With a white light LED they are ideal for non-contact surface profiling and thickness measurements.
The extraordinarily high dynamics range and excellent signal to noise ratio of the CHRocodile sensors ensure the best results on surfaces with differing reflectivity and from different angles. Sensors can be simply switched from chromatic-confocal mode to interferometric mode, and are universally applicable in quality assurance and production.

 

CHRocodile E

The proven optical sensor CHRocodile E is perfectly suitable for non-contact measurement of topography and layer thickness. The senor implements two different measuring procedures and thus provides gauge measurements of 1 µm to 37 mm. The exceptional high dynamic and the excellent signal/noise ratio of the CHRocodile sensors provide the best measuring result on various strongly reflecting and strongly steep surfaces.

 

CHRocodile LR

The proven optical sensor CHRocodile LR is perfectly suitable for non-contact measurement of topography and layer thickness. The sensor implements two different measuring procedures and thus makes gauge measurements of 30 µm to 1200 µm possible and distance measurements with a lateral resolution in the sub-micro meter range. The strong light source and exceptional high dynamic and the excellent signal/noise ratio provide the best measuring result on various strongly reflecting and very slanted surfaces.

 

CHRocodile M4

The proven optical sensor CHRocodile M4 is perfectly suitable for non-contact measurement of topography and layer thickness. It is designed specifically for industrial inline application with up to 4 channels in a 19″ insertion. Two different types of modules are available: High Sensitivity and High Resolution. Das CHRocodile M4 High Resolution implements two different measuring procedures and thus makes gauge measurements of 1µm to 37 mm possible. The CHRocodile M4 High Sensitivity captures the layer gauge of darker materials (e.g. brown container glass) at the full measuring rate.

 

Additional Information:

CHRocodile C Data Sheet
CHRocodile2 IT1000 Data Sheet
CHRocodile IT500 1000RW Data Sheet
CHRocodile IT TW Data Sheet
CHRocodile DW Data Sheet
CHRocodile LR Data Sheet
CHRocodile S Data Sheet
CHRocodile SE Data Sheet
ChRocodile E Data Sheet
CHRocodile LR Data Sheet
CHRocodile M4 Data Sheet

 

For your demonstration please contact Armstrong Optical (44 (0)1604 654220) or CLICK HERE

Price: £0.00